Models of the interaction of metal tips with insulating surfaces

• Thomas Trevethan,
• Matthew Watkins and
• Alexander L. Shluger

Beilstein J. Nanotechnol. 2012, 3, 329–335, doi:10.3762/bjnano.3.37

• . Keywords: atomic force microscopy; density functional theory; ionic surfaces; metallic asperities; surface interactions; Introduction The noncontact atomic force microscope (NC-AFM) is capable of imaging both conducting and insulating systems with true atomic resolution and has provided extraordinary